Semiconductor Wafer Inspection
By using reflected light microscopy wafers can be inspected for contaminants, roughness or flatness. Brightfield, darfield, and DIC are appropriate methods to ...

Shading
Gradual noise and sensitivity variations across the CCD chip and the corresponding inherent intensity gradients in the images are termed ...

Single molecule fluorescence detection with TIRFM
Commencing as a challenging problem in physics with the first detection of a single fluorescent molecule in condensed phase at temperatures of liquid helium single molecule fluorescence detection has ...

Slow-Scan Cameras
CCD cameras are often termed slow-scan cameras because their standard frame rate is usually less than that of a video camera. The "scan" derives ...

Spectral unmixing
A major problem in live cell imaging arises from the use of different fluorochromes with overlapping spectra within one sample, impairing a ...

Spherical aberration
see Aberration, optical