 Certified accuracy and repeatability
High resolution (down to 120nm L&S)
Outstanding slope detection capability
(up to 85°)
Fast and easy operation environment
Roughness testing according to all
standards
Advanced dual pinhole technology for
superior flexibility |
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LEXT OLS4000 - the new reference for measurement on microscopic level
The new OLS4000 with its unique dual pinhole technology fulfils the requirements of any thinkable material structure. Identify your feature of interest quickly and reliable with the new GUI design, which support research and inspection processes at any step. With its outstanding accuracy and resolution while not affecting the sample itself, the new LEXT will help you to quickly discover the last unknown properties of your sample topography. The extreme fast film thickness measurement, the flexible line roughness mode and the precise color quality of the build in CCD rounds up the feature spectrum of the OLS4000. Find it more easy than ever to create professional reports and to standardize measurements according to your requirements.
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