Characterization and measurement of banded or oriented microstructures Automatic creation of detailed report of the banding characterisation, degree of orientation, band spacing and free path spacing. Standard supported: ASTM E 1268
Assesses the degree of banding or orientation of microstructures
Supported Standards
ASTM E1268
Measurement Types
Automatic measurement (interactive grey scale threshold setting, grid definition: line spacing x, line spacing y, boundary width)
Report/Output
Spreadsheet (feature interceptions [1/mm], anisotropy index, degree of orientation, spacing center to center [µm], phase fraction [%], spacing edge to edge [µm], statistics: average, standard deviation, 95% confidence level)
Characterization and measurement of 
