 |
 Measurement based on: grain-boundary
reconstruction
Grain boundaries: light, dark or etched
grain surfaces
Results: g values and statistics,
sandwich-layer analysis, bimodal
structural analysis, statistics on
grain sizes and grain-size histograms,
detailed single-grain analyses,
elongation
Display of results as an overlay to the
image and as a spreadsheet
Automatic creation of compliant report
Standard supported: DIN 50601,
JIS G 0552, ASTM E 112 |
