Specifications of Extension Grain Sizing Planimetric |
 |
 Measurement based on: grain-boundary
reconstruction
Grain boundaries: light, dark or etched
grain surfaces
Results: g values and statistics,
sandwich-layer analysis, bimodal
structural analysis, statistics on
grain sizes and grain-size histograms,
detailed single-grain analyses,
elongation
Display of results as an overlay to the
image and as a spreadsheet
Automatic creation of compliant report
Standard supported: DIN 50601,
JIS G 0552, ASTM E 112 |
 Back to main page |
 Print |
| Description |
Analyses the grain size (Planimetry method) |
| Supported Standards |
ASTM E112, DIN 50601, JIS G0552 |
| Measurement Types |
Automatic measurement (manual definition of separator and sandwich threshold) |
| Report/Output |
Spreadsheet (G number :elongated, single grain, sandwich, elongation number, dual grain, percent of grains / class), Chart (Grain size frequency distribution), Image with overlay (Detected grain bounderies)
|
|
|
|
|
|
|
