Layer Thickness Measurement

Layer Thickness Measurement
Key FeaturesSpecifications
Determination of the thickness of single
    and multiple layers of cross-sectioned
    samples
Support of perpendicular to neutral
    fibres
Support of shortest distance
Tracking the contours of arbitrarily-
    shaped surfaces
Neutral fibre method integrated
Layer Thickness Measurement
The layer thickness measurement extension is designed to determine the thickness of single or multiple layers of cross-sectioned samples. The layer thicknesses are measured either perpendicular to neutral fibres or using the shortest distance. This means that during evaluation, the contours of arbitrarily shaped surfaces are tracked. Furthermore, the integrated neutral fibre method ensures that highly complex layer geometries can be measured and described as an orientation line throughout the course of the entire layer.
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Material Properties - Microscope Measurement - Image Analysis, Image Processing, Particle Size Analysis
Micro Hardness Measurement
Material Properties - Microscope Software Measurement - Image Analysis, Image Processing, Particle Size Analysis
Weld Measurement
Materials Properties - Materials Science imaging - Microscope Analysis Software - Image Analysis/Image Processing
Interactive Phase Count
 



Layer Thickness Measurements
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